Taipei, Feb. 2 (CNA) A National Cheng Kung University (NCKU) research team unveiled a new technology Thursday that it described as a breakthrough in the science of measurement in the field of semiconductor, flat panel and solar energy manufacturing.
The technology, known as an automatic virtual metrology (AVM), can reduce the measurement process in such industries from the usual four hours to six minutes, according to Cheng Fan-tien, director of the NCKU's e-Manuf. Research Center.
The AVM system can also expand the measurement scale from the current "random" mode to "all" mode, inspecting and measuring all parts to be tested at the same time, said Cheng, leader of the NCKU research team.
The technology, which can help increase production quality and cut manufacturing time, may help major semiconductor, TFT-LCD display panel and photovoltaics manufacturers save at least US$20 million each per year, he said.
NCKU has already secured patent rights for the technology in Taiwan, China, the United States, Japan and South Korea, according to Cheng.
The university recently transferred the technology to the Tainan-based ForeSight Technology Co. for commercial production of the system and related services, Cheng said.
(By Hsu Chih-wei and Deborah Kuo)